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The Hall Effect and the Lorentz Force

The basic physical principle underlying the Hall effect is the Lorentz force. When an electron moves along a direction perpendicular to an applied magnetic field, it experiences a force acting normal to both directions and moves in response to this force and the force effected by the internal electric field. For an n-type, bar-shaped semiconductor shown in Fig.1, the carriers are predominately electrons of bulk density n. We assume that a constant current I flows along the x-axis from left to right in the presence of a z-directed magnetic field. Electrons subject to the Lorentz force initially drift away from the current line toward the negative y-axis, resulting in an excess surface electrical charge on the side of the sample. This charge results in the Hall voltage, a potential drop across the two sides of the sample. (Note that the force on holes is toward the same side because of their opposite velocity and positive charge.) This transverse voltage is the Hall voltage VH and its magnitude is equal to IB/qnd, where I is the current, B is the magnetic field, d is the sample thickness, and q (1.602 x 10-19 C) is the elementary charge. In some cases, it is convenient to use layer or sheet density (ns = nd) instead of bulk density.

One then obtains the equation
                                                      
ns = IB/q|VH|                                        (1)
Thus, by measuring the Hall voltage VH and from the known values of I, B, and q, one can determine the sheet density ns of charge carriers in semiconductors. If the measurement apparatus is set up as described later in Section III, the Hall voltage is negative for n-type semiconductors and positive for p-type semiconductors. The sheet resistance RS of the semiconductor can be conveniently determined by use of the van der Pauw resistivity measurement technique. Since sheet resistance involves both sheet density and mobility, one can determine the Hall mobility from the equation
                                      
µ = |VH|/RSIB = 1/(qnSRS)                              (2)
If the conducting layer thickness d is known, one can determine the bulk resistivity (r = RSd) and the bulk density (n = nS/d).

Halleffect
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